Engineers in a lab reviewing a holographic neural network above a chip, representing AI-assisted chip design and verification

EDA Solutions

TOOL Corporation

LV+: a visualisation platform that stays fast on very large layouts

Layout Viewer
GDS/OASIS
DRC/DFM
Pattern Matching

TOOL LV+ (Lavis Plus) is an all-round layout visualisation platform that handles very large layout databases with excellent performance, integrating node tracing, DRC/DFM error review, pattern matching and defect analysis.

Products & capabilities

TOOL Corporation portfolio

Layout visualisation

LV+ (Lavis Plus)

A versatile layout visualisation platform with best-in-class performance.

Standard formats: GDS, OASIS, Jobdeck, LEF/DEF
Powerful node tracing: space/width checking, double via checking and more
Layout to Schematic, and Image to Layout
DRC/DFM error listing and checking
Easy-to-use pattern matching
Interfaces with ICV, Calibre and Hamamatsu, plus KLA defect analysis
Rich additional features: cross section, 3DV, density, editing and logical operations

Format tools

OASIS Utility

A GDS/OASIS converter that also performs format checking and linting.

Calculation

RSCalc

A layout-related calculation aid.

Want to know more about TOOL Corporation?

We can arrange a vendor technical briefing, an evaluation licence and a deployment plan to get your team productive quickly.